Imperial College London
Portrait Picture

Professor Tom Pike

Faculty of Engineering, Department of Electrical and Electronic Engineering

Professor of Microengineering
 
 
 
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Contact

 

+44 (0)20 7594 6207w.t.pike

 
 
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Location

 

604Electrical EngineeringSouth Kensington Campus

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Summary

 

Publications

Citation

BibTex format

@article{van:2021:10.1029/2020JE006670,
author = {van, Driel M and Ceylan, S and Clinton, JF and Giardini, D and Horleston, A and Margerin, L and Stahler, SC and Bose, M and Charalambous, C and Kawamura, T and Khan, A and Orhand-Mainsant, G and Scholz, J-R and Euchner, F and Knapmeyer, M and Schmerr, N and Pike, WT and Lognonne, P and Banerdt, WB},
doi = {10.1029/2020JE006670},
journal = {JOURNAL OF GEOPHYSICAL RESEARCH-PLANETS},
title = {High-Frequency Seismic Events on Mars Observed by InSight},
url = {http://dx.doi.org/10.1029/2020JE006670},
volume = {126},
year = {2021}
}
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RIS format (EndNote, RefMan)

TY  - JOUR
AU  - van,Driel M
AU  - Ceylan,S
AU  - Clinton,JF
AU  - Giardini,D
AU  - Horleston,A
AU  - Margerin,L
AU  - Stahler,SC
AU  - Bose,M
AU  - Charalambous,C
AU  - Kawamura,T
AU  - Khan,A
AU  - Orhand-Mainsant,G
AU  - Scholz,J-R
AU  - Euchner,F
AU  - Knapmeyer,M
AU  - Schmerr,N
AU  - Pike,WT
AU  - Lognonne,P
AU  - Banerdt,WB
DO  - 10.1029/2020JE006670
PY  - 2021///
SN  - 2169-9097
TI  - High-Frequency Seismic Events on Mars Observed by InSight
T2  - JOURNAL OF GEOPHYSICAL RESEARCH-PLANETS
UR  - http://dx.doi.org/10.1029/2020JE006670
UR  - https://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000624377600012&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a2bf6146997ec60c407a63945d4e92bb
VL  - 126
ER  -
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